fig11

Figure 11. (A) XRD pattern of the Ag₂Se film; (B) Low magnification FESEM image of Ag₂Se film; (C) High magnification FESEM image of Ag₂Se film; (D) Overview high-angle annular dark field-STEM image; (E) Typical STEM image; (F) FFT image corresponding to (E); (G) Temperature dependence of Seebeck coefficient, electrical conductivity, and power factor for the Ag₂Se film. Reproduced with permission from Ref^[92]. Copyright^© 2019. Springer Nature. FESEM: Field emission scanning electron microscopy; FFT: fast Fourier transform; STEM: scanning transmission electron microscopy; XRD: X-ray diffraction analysis.