fig10

Vacuum filtration method towards flexible thermoelectric films

Figure 10. (A-F) SEM images of SWCNT/Bi2Te3 composite films, corresponding to mass ratios of the SWCNTs to Bi2Te3-0.6/0.8/1/5/10/15; (G-J) HRTEM of SWCNTs@Bi2Te3-5; (K) XRD patterns of a series of SWCNT@Bi2Te3 films, pristine Bi2Te3 power, and pristine SWCNT film. Reproduced with permission from Ref[86]. Copyright© 2021. American Chemical Society. HRTEM: High-resolution transmission electron microscopy; SEM: scanning electron microscope; SWCNT: single-walled carbon nanotube; XRD: X-ray diffraction analysis.

Soft Science
ISSN 2769-5441 (Online)
Follow Us

Portico

All published articles are preserved here permanently:

https://www.portico.org/publishers/oae/

Portico

All published articles are preserved here permanently:

https://www.portico.org/publishers/oae/