fig5

Figure 5. Schematic diagram of APCs with different dimensions in 2G-HTS tapes. (A) 0D atomic-level point defects, which mainly refer to defects smaller than ξ, usually with vacancies and element substitutions. (B) 1D defects (linear defects), including dislocations, self-assembled nanorods, and irradiated columnar defects. (C) 2D planar defects, including twin boundaries and stacking faults. (D) 3D large-size defects, including rare-earth oxide particles, secondary phase particles, defect clusters, and holes^[89] © 2016 IOP Publishing Ltd. Printed in the UK.